XRF-Spectrometer LXRF-A10 is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.
Get Catalog| Measureable elements | S to U |
| Detection limit | 1 ppm |
| Temperature | 15 ~ 30 °C |
| Elemental content | 1 ppm to 99 % |
| Repeatability | 0.001 |
| Stability | 0.001 |
| Power supply | AC 220 V ± 5 V |
| Dimensions | 550 x 410 x 320 mm |
| Weight | 45 kg |
Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries
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| Wavelength range ( 3600 lines / mm ) | 180 to 500 nm |
| Wavelength range ( 2400 lines / mm ) | 180 to 800 nm |
| Temperature | 20 ~ 28 °C |
| Monochromator Specifications | Czerny turner, ≤ 0.015nm (3600 line grating) ≤ 0.030nm (2400 line grating), 1000 mm, huge holographic grating with 3600 L/mil or 2400 L/mil and 80 mm × 100 mm of ruling area, 195 to 500 nm for 3600 line grating 195 to 800 nm for 2400 line grating |
| Solid State Power Specifications | 27.12 MHz Frequency stability: < 0.05%, Scott double pass spray chamber, 800 W to 1600 W, adjustable with power efficiency more than 65%, ≤ 0.05%, 25 mm × 3 ID (ID-internal diameter), equipped with three concentric quartz torch tubes 35 mm ED (ED-external diameter) |
| Technical Specifications | Liquid sample: 0.01 ppm to several thousand ppm Solid or power sample: 0.001% to 70%, short-term stability- RSD ≤ 1.5% Long-term stability: RSD ≤ 2%, 5 to 8 elements / min, 1ppb to 10ppb |
| Wavelength range | 180 to 900 nm |
| Elements per minute | 15 elements |
| Temperature | 29 °C |
| Analytical Method | Energy dispersive X-ray fluorescence analytical Method |
| Elements Measuring | Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured |
| Range | Simultaneous detector |
| Analytical Method | Energy dispersive X-ray fluorescence analytical Method |
| Elements Measuring | Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured |
| Range | Simultaneous detector |
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