XRD Diffractometer LXRD-A10

XRD Diffractometer LXRD-A10 contains tube current up to 5 to 80 mA with a dimension 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm and are designed for quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications, This multipurpose diffractometers are all equipped with X-ray tuble of glass tube, ceramic tube, ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo) and is coupled with an auto-switching dual wavelength optic. It have Low maintenance, high performance system and designed with Horizontal Goniometer structure and proportional/Scintillation counters detector.

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X-ray Tuble Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW
Focus Size 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
Stability ≤ 0.01 %
Tube Current 5 to 80 mA
Tube Voltage 10 to 60 kV
Rated Power 3 kW
Goniometer Structure Horizontal (Ø to 2 Ø )
Radius of Diffraction 185 mm
Scanning Range 0 to 164
Scanning Speed 0.0012º to 70 º min
Maximum Resolving Speed 100 º / min
Scanning Mode Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping scanning
Angle Repeatable Accuracy 1 / 1000 º
Minimal Stepping Angle 1 / 1000 º
Detector Proportional/Scintillation counters
Maximum Counting rate of Linearity 5 × 105 CPS (with the compensate function of dropout counting)
Energy Resolution Ratio ≤ 25 % (PC), ≤ 50 % (SC)
Counting Fashion Differential Coefficient / integral, PHA automatically, Dead time regulate
Stability of System measure ≤ 0.01 %
Scattered Rays Dose ≤ 1 µ Sv/h (without X-ray protective device)
Instrument Integrative Stability ≤ 0.5 %
Dimension 1100 × 850 × 1750 mm
Weight About 25 kg
  • Diffractometer is equipped with X-ray tuble of glass tube, ceramic tube, and ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo)
  • Coupled with an auto-switching dual wavelength optic
  • Horizontal Goniometer structure
  • Proportional/Scintillation counters detector
  • For testing unknown samples it has phase identification and phase analysis for known mixed samples
  • Crystal structure varies with temperature (high temperature vice versa) factor and chemical information tested by X-ray diffraction test device
  • Equipped with programmable operation, integrated structure design with easy operation and well-designed outlook
  • High throughput with high accuracy diffraction angle measurement
  • Scanning range and Scanning speed are well design in equipment

Best suited for the research and industrial product analysis with perfect combination of conventional analysis crucial measurement product and for academics and researchers in different application areas.

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ICP Spectrometer

ICP Spectrometer : ICP spectrometer LICP-A10
Wavelength range ( 3600 lines / mm )180 to 500 nm
Wavelength range ( 2400 lines / mm )180 to 800 nm
Temperature20 ~ 28 °C
ICP Spectrometer : ICP Spectrometer LICP-B10
Monochromator SpecificationsCzerny turner, ≤ 0.015nm (3600 line grating) ≤ 0.030nm (2400 line grating), 1000 mm, huge holographic grating with 3600 L/mil or 2400 L/mil and 80 mm × 100 mm of ruling area, 195 to 500 nm for 3600 line grating 195 to 800 nm for 2400 line grating
Solid State Power Specifications27.12 MHz Frequency stability: < 0.05%, Scott double pass spray chamber, 800 W to 1600 W, adjustable with power efficiency more than 65%, ≤ 0.05%, 25 mm × 3 ID (ID-internal diameter), equipped with three concentric quartz torch tubes 35 mm ED (ED-external diameter)
Technical SpecificationsLiquid sample: 0.01 ppm to several thousand ppm Solid or power sample: 0.001% to 70%, short-term stability- RSD ≤ 1.5% Long-term stability: RSD ≤ 2%, 5 to 8 elements / min, 1ppb to 10ppb
ICP Spectrometer : ICP Spectrometer LICP-A11
Wavelength range180 to 900 nm
Elements per minute15 elements
Temperature29 °C

XRF Spectrometer

XRF Spectrometer : Handheld XRF Spectrometer LXRF-B10
Analytical MethodEnergy dispersive X-ray fluorescence analytical Method
Elements MeasuringAtomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
RangeSimultaneous detector
XRF Spectrometer : Handheld XRF Spectrometer LXRF-B11
Analytical MethodEnergy dispersive X-ray fluorescence analytical Method
Elements MeasuringAtomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
RangeSimultaneous detector
XRF Spectrometer : XRF-Spectrometer LXRF-A10
Measureable elementsS to U
Detection limit1 ppm
Temperature15 ~ 30 °C