Portable Spectrophotometer LSP-A31 is adopted with 45/0 geometry (45 ring shaped illumination, 0 degree observation angle), where the standard white board is included in the optical system for great accuracy of every measurement. Equipped with automatic gloss compensation technology ensures the accuracy of the color measurement data for the surface of different gloss. Large data storage space up to 20000 samples measurement records. The measurement of the color of the powder, granules and other materials can be done by adding the powder accessories to this spectrophotometer.
Get Catalog| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | 60° |
| Test area | 5 × 10 mm |
| Test range | 0 to 1000 GU |
| Test repeatability | 0.2 GU (0 to 100 GU), 0.2% (100 to 1000 GU) |
| Reproducibility | 1.0 GU (0 to 100 GU), 1.0% (100 to 1000 GU) |
| Inter instrument agreement | 0.2 ΔE*ab (BCRA II color tiles, average test value of 12 tiles) |
| Illumination light source | LED |
| Light source | A, C, D50, D55, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, CWF, NBF, TL83, TL184, NBF, U35 |
| Wavelength range | 400 nm to 700 nm |
| Wavelength interval | 10 nm |
| Observation angle | 2°/10° |
| Measuring aperture | 11 mm |
| Color space | CIE-L*a*b, L*C*h, L*u*v, XYZ, Yxy, Reflectance, Hunter-lab, Munsell MI, CMYK |
| Color difference formula | ΔE*ab, ΔE*CH, ΔE*uv, ΔE*cmc(2:1), ΔE*cmc(1:1),ΔE*94, ΔE*00, ΔEab(Hunter), 555 shade sort |
| Other colorimetric indices | WI (whiteness) (ASTM E313-10,ASTM E313-73,CIE/ISO, AATCC, Hunter, Taube Berger, Ganz, Stensby) YI (yellowness) (ASTM D1925，ASTM E313-00,ASTM E313-73), Tint (ASTM E313,CIE,Ganz) Metamerism index Milm, Stick color fastness, Color fastness, ISO brightness, A density, T density, M density, E density. |
| Color matching system | Not included |
| UV light source | Not included |
| Work temperature range | 0 to 45℃, relative humidity 80% or below( at 35°C ),no condensation |
| Battery capacity | Rechargeable Lithium battery, 20000 continuous measurement tests, 7.4V/600 mAh |
| Interface | USB |
| Data storage | 20000 samples |
| Display | True color TFT touch screen |
| Light source longevity | 10 years, 3 million test |
| Dimension | 181 × 73 × 112 mm |
| Weight | 800 g (without battery) |
Used in textile, plastic, food, paint, printing, automobile industries, laboratories & on-site applications for quality control purpose.
Request Quote
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.0 nm |
| Optical System | Double beam |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.8 nm |
| Optical system | Double beam; 1200 lines/mm grating |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
| Wavelength | 260 nm and 280 nm; Fixed |
| Spectral resolution | ≤ 8 nm |
| Path length | 0.5 mm |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
| Wavelength Range | 325 ~ 1000 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
Labtron Atomic Absorption Spectrophotometer makes use of the modern in technology. It is acquired after thorough research into the desires of the diagnostic community. It has all the power, performance and speed necessitated in today’s modern laboratory.
| Working spectral range | 190 to 900 nm |
| Spectral Bandwith | 0.1, 0.2, 0.4, 1.0 and 2.0 nm |
| Wavelength accuracy | ± 0.15 nm |
| Monochromator | |
| Wavelength range | 190 - 900 nm |
| Spectral Bandwidth | 0.2 nm, 0.4 nm, 0.7 nm, 1.4 nm, 2.4 nm, 5.0 nm |
| Monochromator | |
| Wavelength range | 180 - 900 nm |
| Spectral Bandwidth | 0, 0.2, 0.4, 1.0, 2.0nm (Automatic setting) |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Illumination system | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab |
| Sensor | High sensitivity silicon photodiode |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
Copyright @ labtrononline.com
